Single Insertion Testing of Asymmetric TX/RX SerDes Interfaces with High-Density Loopback Relays

May 7, 2025

Single Insertion Testing of Asymmetric TX/RX SerDes Interfaces with High-Density Loopback Relays

Menlo Micro webinar hosted by Microwave Journal, in partnership with RFMW 

Overview

This webinar explored the process of single insertion testing for asymmetric TX/RX SerDes interfaces, utilizing the Menlo Micro Dual DP3T relay with integrated high-density loopback relays. This solution is ideal for high-speed applications such as PCIe Gen5/6, CXL, USB/Thunderbolt, and Ethernet, offering precise control and reliable performance in demanding environments.

The session provided a detailed overview of testing complex SerDes interfaces, focusing on the challenges and methodologies for controlling both TX and RX differential pairs, including asymmetric signal flows. Key topics will include optimizing high-speed testing for frequencies up to 20 GHz, simplifying test setups, and reducing testing complexity. Attendees will gain practical insights into fixture design, PCB design parameters, and techniques to minimize impedance discontinuities.

The webinar covered the differential signaling scheme, eye diagram test setup and conditions, and a comparison of measured eye-diagram performance versus simulation results. Additionally, we demonstrated how the combination of PCIe 6.0 loopback and differential DP3T MEMS switches ensures optimal eye height and width, without the need for pre-emphasis or equalization.

Access the replay.