Technology
Markets
Company
Login
Buy Now
High-Speed Path (HS) allows for full compliance at speed testing with DUT loopback
Med-Speed Path (MS) allows for scan and digital patterns sourced from ATE.
Low-Speed Path (LS) allows for full DC parametric testing from ATE
There is no need for dual-insertion testing.
All critical routing is built in with AC coupling caps, drastically simplifying layout for PCB designers, and easing SI challenges at high-speeds.
| Function | Frequency | Insertion Loss | Switch Speed | Lifetime | Controller | VBB or VIN VDD | Packaging | |
|---|---|---|---|---|---|---|---|---|
| MM5620 | 2x DP3T | DC-20 GHz 64 Gbps | -1.5 dB @ 16 GHz | <30 µs | >3B cycles | SPI/GPIO | 5 V 3.3 V | 8.2 x 8.2 mm LGA |
| MM5622 | 2x DP3T | DC-20 GHz 80 Gbps | -2.2 dB @ 20 GHz | <30 µs | >3B cycles | SPI/GPIO | 5 V 3.3 V | 8.2 x 8.2 mm LGA |
| MM5625 | 2x DP3T | DC-20 GHz 80 Gbps | -2.7 dB @ 20 GHz | <30 µs | >3B cycles | SPI | 5 V 3.3 V | 8.2 x 8.2 mm LGA |
The MM5620 is a high-speed differential loopback switch (AC coupled) supporting the high-speed differential signal switching required in PCIe Gen 6, SerDes and other applications. The MM5620 is based on Menlo’s Ideal Switch® technology and can operate up to 64 Gbps or 20 GHz for high-performance applications.
The MM5620 has low insertion loss, fast switching speed, and can operate with greater than 3 billion switching cycles. The MM5620’s integrated charge pump and driver can be controlled through SPI or GPIO interfaces by a host processor.
Access additional design information on the
Menlo Support Portal >
Top View
Top View
Bottom View
Bottom View
PAM4 Eye Diagram
• DC to 20 GHz range
• Differential Dual DP3T switch with Loopback
• Normally Open, Reflective actuator
• Low Insertion Loss: -1.5 dB @ 16 GHz
• Integrated charge pump and driver eliminates the requirement for external biasing and driver circuitry
• Built-in AC Coupling Capacitors
• Fully controllable ports for low, medium, and high data rate signal routing
• High Reliability: >3 Billion switching operations
• 8.2 x 8.2 mm LGA Package
• Automated Test Equipment
• Measurement Equipment
• Semiconductor Final Package Test
• Compliance and Loopback Test
• High-Speed Data Digital Component Testing
• Optical-Electrical Module Testing
• High-Speed Signal Routing
• ATE Device Interface Boards
• Optical-Electrical Module Testing
• Differential Switch Matrices
 | EM (SMT) SPDT | Key Benefits | |
|---|---|---|---|
| Market | High-speed digital & RF DIB/PIB market | High-speed digital & RF DIB/PIB market | |
| Configuration | DP3T DC-20 GHz/64 Gbps | SPDT 18 GHz/40 Gbps | Dual DP3T with built-in loopback capacitor |
| Power Consumption | < 10 mW | 200 mW | 95% reduction in power consumption |
| Reliability | >3B operations | 3M operations | 1000x increase in lifetime: reduced down-time, maintenance and cost |
| Switching Time | <30 µs | 5 ms operation time | x165 speed increase: reduced test time and cost-to-test |
| Size/Chip Density | 141.2 mm3 8.2 x 8.2 x 2.1 mm LGA | 1103.3 mm3 SMT 11x8.5(d) x 11.8 (h) | 85% volume reduction: enables more parallel tests, easier routing (top and/or bottom) |
The MM5622 is a high-speed differential loopback switch (DC coupled) supporting the high-speed differential signal switching required in the latest PCIe Gen 5, Gen 6, SerDes, and other standards. The MM5622 is based on Menlo’s Ideal Switch® technology and can operate at 80 Gbps with a bandwidth of 20 GHz for high-performance applications.
The MM5622 has low insertion loss, fast switching speed, and can operate with greater than 3 billion switching cycles. The MM5622 system-in-package (SiP) solution fully integrates the switch driver and charge pump controlled through SPI or GPIO interfaces by a host processor. In addition, integrated decoupling capacitors provide significant board footprint reduction for high-volume production test solutions.
Access additional design information on the
Menlo Support Portal >
Top View
• DC to 20 GHz range
• Differential Dual DP3T switch with Loopback
• Normally Open, Reflective actuator
• Low Insertion Loss: -2.2 dB @ 20 GHz
• Integrated charge pump and driver eliminates the requirement for external biasing and driver circuitry
• Fully controllable ports for low, medium, and high data rate signal routing
• High Reliability: >3 Billion switching operations
• 8.2 x 8.2 mm LGA Package
• Automated Test Equipment
• Measurement Equipment
• Semiconductor Final Package Test
• Compliance and Loopback Test
• High-Speed Data Digital Component Testing
• Optical-Electrical Module Testing
• High-Speed Signal Routing
• ATE Device Interface Boards
• Optical-Electrical Module Testing
• Differential Switch Matrices
| EM (SMT) SPDT | Key Benefits | |
|---|---|---|---|
| Market | High-speed digital & RF DIB/PIB market | High-speed digital & RF DIB/PIB market | |
| Configuration | DP3T DC-20 GHz/80 Gbps | SPDT 18 GHz/40 Gbps | Dual DP3T with built-in decoupling capacitor |
| Power Consumption | < 10 mW | 200 mW | 95% reduction in power consumption |
| Reliability | >3B operations | 3M operations | 1000x increase in lifetime: reduced down-time, maintenance and cost |
| Switching Time | <30 µs | 5 ms operation time | x165 speed increase: reduced test time and cost-to-test |
| Size/Chip Density | 141.2 mm3 8.2 x 8.2 x 2.1 mm LGA | 1103.3 mm3 SMT 11x8.5(d) x 11.8 (h) | 85% volume reduction: enables more parallel tests, easier routing (top and/or bottom) |
The MM5625 is a high-speed differential loopback switch (AC coupled) supporting the high-speed differential signal switching required in the latest PCIe Gen 5, Gen 6, SerDes, and other standards.
The MM5625 is based on Menlo Micro’s Ideal Switch® technology and can operate at 80 Gbps with a bandwidth of 20 GHz for high-performance applications. Each differential pair can be controlled individually and there are 128 possible switch control states.
The MM5625 has low insertion loss, fast switching speed, and can operate with greater than 3 billion switching cycles.
Access additional design information on the
Menlo Support Portal >
Top View
Bottom View
• DC to 20 GHz range
• Differential Dual DP3T switch with Loopback
• Normally Open, Reflective actuator
• Low Insertion Loss: -2.7 dB @ 20 GHz
• Integrated charge pump and driver eliminates the requirement for external biasing and driver circuitry
• Built-in AC Coupling Capacitors
• Fully controllable ports for low, medium, and high data rate signal routing
• High Reliability: Greater than 3 billion switching operations
• 8.2 x 8.2 mm LGA Package
• 128 possible switch control states
• Automated Test Equipment
• Measurement Equipment
• Semiconductor Final Package Test
• Compliance and Loopback Test
• High-Speed Data Digital Component Testing
• Optical-Electrical Module Testing
• High-Speed Signal Routing
• ATE Device Interface Boards
• Optical-Electrical Module Testing
• Differential Switch Matrices
| EM (SMT) SPDT | Key Benefits | |
|---|---|---|---|
| Market | High-speed digital & RF DIB/PIB market | High-speed digital & RF DIB/PIB market | |
| Configuration | DP3T DC-20 GHz/80 Gbps | SPDT 18 GHz/40 Gbps | Dual DP3T with built-in decoupling capacitor |
| Power Consumption | < 10 mW | 200 mW | 95% reduction in power consumption |
| Reliability | >3B operations | 3M operations | 1000x increase in lifetime: reduced down-time, maintenance and cost |
| Switching Time | <30 µs | 5 ms operation time | x165 speed increase: reduced test time and cost-to-test |
| Size/Chip Density | 141.2 mm3 8.2 x 8.2 x 2.1 mm LGA | 1103.3 mm3 SMT 11x8.5(d) x 11.8 (h) | 85% volume reduction: enables more parallel tests, easier routing (top and/or bottom) |
